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Issue DateTitle / Author(s) / CitationFileAltmetrics
2018-08

Jang, Bongho; Kim, Taegyun; Lee, Sojeong; Lee, Won-Yong; Kang, Hongki; Cho, Chan Seob; Jang, Jaewon

IEEE Electron Device Letters, Vol.39 No.8, pp.1179-1182

DOI
1