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Issue Date	Title / Author(s) / Citation	File	Altmetrics
2018-05	SARO: A State-Aware Reliability Optimization Technique for High Density NAND Flash Memory Kim, Myungsuk; Song, Youngsun; Jung, Myoungsoo; Kim, Jihong PROCEEDINGS OF THE 2018 GREAT LAKES SYMPOSIUM ON VLSI (GLSVLSI'18), pp.255-260	DOI