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Issue DateTitle / Author(s) / CitationFileAltmetrics
2016-03

Yoon, Heein; Lee, Yongsun; Lim, Younghyun; Tak, Geum-Young; Kim, Hong-Teuk; Ho, Yo-Chuol; Choi, Jaehyouk

IEEE JOURNAL OF SOLID-STATE CIRCUITS, Vol.51 No.3, pp.614-625

DOI
1