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Issue Date	Title / Author(s) / Citation	File	Altmetrics
2008-04	Low-frequency noise characterization of ZnO nanorod back-gate field-effect transistor structure Lee, Jungil; Yu, Byung-Yong; Lee, Chul Ho; Yi, Gyu-Chul; Son, Seung Hun; Kim, Gyu-Tae; Ghibaudo, Gerard Physica E: Low-Dimensional Systems and Nanostructures, Vol.40 No.6, pp.2147-2149	DOI
2015-11	Fluorinated CYTOP passivation effects on the electrical reliability of multilayer MoS2 field-effect transistors Roh, Jeongkyun; Cho, In-Tak; Shin, Hyeonwoo; Baek, Geun Woo; Hong, Byung Hee; Lee, Jong-Ho; Jin, Sung Hun; Lee, Changhee Nanotechnology, Vol.26 No.45, p. 455201	DOI
2018-07	Two-dimensional thickness-dependent avalanche breakdown phenomena in MoS2 field-effect transistors under high electric fields Pak, Jinsu; Jang, Yeonsik; Byun, Junghwan; Cho, Kyungjune; Kim, Tae-Young; Kim, Jae-Keun; Choi, Barbara Yuri; Shin, Jiwon; Hong, Yongtaek; Chung, Seungjun; Lee, Takhee ACS Nano, Vol.12 No.7, pp.7109-7116	view file DOI
2019-02	Threshold Voltage Control of Multilayered MoS2 Field-Effect Transistors via Octadecyltrichlorosilane and their Applications to Active Matrixed Quantum Dot Displays Driven by Enhancement-Mode Logic Gates Roh, Jeongkyun; Ryu, Jae Hyeon; Baek, Geun Woo; Jung, Heeyoung; Seo, Seung Gi; An, Kunsik; Jeong, Byeong Guk; Lee, Doh C.; Hong, Byung Hee; Bae, Wan Ki; Lee, Jong-Ho; Lee, Changhee; Jin, Sung Hun Small, Vol.15 No.7, p. 1803852	DOI
2022-11	Normally Off WSe2 Nanosheet-Based Field-Effect Transistors with Self-Aligned Contact Doping Lee, Dongryul; An, Jin Yong; Lee, Chul-Ho; Bong, Ki Wan; Kim, Jihyun ACS Applied Nano Materials, Vol.5 No.12, pp.18462-18468	DOI

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