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Issue DateTitle / Author(s) / CitationFileAltmetrics
2020-11
Unlocking Wordline-level Parallelism for Fast Inference on RRAM-based DNN Accelerator

Park, Yeonhong; Lee, Seung Yul; Shin, Hoon; Heo, Jun; Ham, Tae Jun; Lee, Jae Wook

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, p. 103

DOI
1