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Applications of Sparse Codes: Batched Zigzag Fountain Codes and WOM Codes : 저밀도 부호의 응용: 묶음 지그재그 파운틴 부호와 WOM 부호

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Authors

전보환

Advisor
노종선
Major
공과대학 전기·컴퓨터공학부
Issue Date
2017-02
Publisher
서울대학교 대학원
Keywords
Fountain codeslow-density generator matrix (LDGM) codeslow-density parity-check (LDPC) codesNAND flash memorysolid-state drive (SSD)write-once memory (WOM) codes
Description
학위논문 (박사)-- 서울대학교 대학원 : 전기·컴퓨터공학부, 2017. 2. 노종선.
Abstract
This dissertation contains the following two contributions on the applications of sparse codes.
Fountain codes Batched zigzag (BZ) fountain codes
– Two-phase batched zigzag (TBZ) fountain codes
Write-once memory (WOM) codes
– WOM codes implemented by rate-compatible low-density generator matrix (RC-LDGM) codes

First, two classes of fountain codes, called batched zigzag fountain codes and two-phase batched zigzag fountain codes, are proposed for the symbol erasure channel. At a cost of slightly lengthened code symbols, the involved message symbols in each batch of the proposed codes can be recovered by low complexity zigzag decoding algorithm. Thus, the proposed codes have low buffer occupancy during decoding process. These features are suitable for receivers with limited hardware resources in the broadcasting channel. A method to obtain degree distributions of code symbols for the proposed codes via ripple size evolution is also proposed by taking into account the released code symbols from the batches. It is shown that the proposed codes outperform Luby transform codes and zigzag decodable fountain codes with respect to intermediate recovery rate and coding overhead when message length is short, symbol erasure rate is low, and available buffer size is limited.

In the second part of this dissertation, WOM codes constructed by sparse codes are presented. Recently, WOM codes are adopted to NAND flash-based solid-state drive (SSD) in order to extend the lifetime by reducing the number of erasure operations. Here, a new rewriting scheme for the SSD is proposed, which is implemented by multiple binary erasure quantization (BEQ) codes. The corresponding BEQ codes are constructed by RC-LDGM codes. Moreover, by putting RC-LDGM codes together with a page selection method, writing efficiency can be improved. It is verified via simulation that the SSD with proposed rewriting scheme outperforms the SSD without and with the conventional WOM codes for single level cell (SLC) and multi-level cell (MLC) flash memories.
Language
English
URI
https://hdl.handle.net/10371/119301
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