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Degradation analysis of MEMS device under cyclic loading for reliability-aided design : 신뢰성 기반 설계를 위한 MEMS 소자의 반복구동에 따른 열화 해석
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.advisor | 권동일 | - |
| dc.contributor.author | 김종진 | - |
| dc.date.accessioned | 2009-11-18 | - |
| dc.date.available | 2009-11-18 | - |
| dc.date.copyright | 2005. | - |
| dc.date.issued | 2005 | - |
| dc.identifier.uri | http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000052252 | eng |
| dc.identifier.uri | https://hdl.handle.net/10371/12696 | - |
| dc.description | Thesis(doctoral)--서울대학교 대학원 :재료공학부,2005. | eng |
| dc.format.extent | x, 166 leaves | eng |
| dc.language.iso | en | eng |
| dc.publisher | 서울대학교 대학원 | eng |
| dc.subject | MEMS | eng |
| dc.subject | microelectromechanical systems (MEMS) | eng |
| dc.subject | 신뢰성 | eng |
| dc.subject | reliability | eng |
| dc.subject | 열화 | eng |
| dc.subject | degradation | eng |
| dc.subject | 반복구동 | eng |
| dc.subject | cyclic loading | eng |
| dc.subject | 고장물리 | eng |
| dc.subject | physics-of-failure | eng |
| dc.subject | 신뢰성통계 | eng |
| dc.subject | reliability statistics | eng |
| dc.subject | 실리콘 | eng |
| dc.subject | silicon | eng |
| dc.subject | 니켈 | eng |
| dc.subject | nickel | eng |
| dc.title | Degradation analysis of MEMS device under cyclic loading for reliability-aided design | eng |
| dc.title.alternative | 신뢰성 기반 설계를 위한 MEMS 소자의 반복구동에 따른 열화 해석 | eng |
| dc.type | Thesis | - |
| dc.contributor.department | 재료공학부 | - |
| dc.description.degree | Doctor | eng |
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