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Electrochemical migration behavior of Sn-based solder alloys for electronic packaging : 전자 패키징용 Sn계 솔더 합금의 Electrochemical migration 거동에 관한 연구
DC Field | Value | Language |
---|---|---|
dc.contributor.advisor | 주영창 | - |
dc.contributor.author | 이신복 | - |
dc.date.accessioned | 2009-11-18T03:28:25Z | - |
dc.date.available | 2009-11-18T03:28:25Z | - |
dc.date.copyright | 2009. | - |
dc.date.issued | 2009 | - |
dc.identifier.uri | http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000038125 | eng |
dc.identifier.uri | https://hdl.handle.net/10371/12863 | - |
dc.description | Thesis(doctors) --서울대학교 대학원 :재료공학부,2009.8. | eng |
dc.format.extent | xiv, 189 leaves | eng |
dc.language.iso | en | eng |
dc.publisher | 서울대학교 대학원 | eng |
dc.subject | 전기화학 마이그레이션 | eng |
dc.subject | electrochemical migration | eng |
dc.subject | 부식 | eng |
dc.subject | corrosion | eng |
dc.subject | 수지상 필라멘트 | eng |
dc.subject | dendritic filament | eng |
dc.subject | 전도성 양극 필라멘트 | eng |
dc.subject | conductive anodic filament | eng |
dc.subject | 물방울 적하 시험 | eng |
dc.subject | Sn | eng |
dc.subject | 양극 분극 시험 | eng |
dc.subject | SnPb | eng |
dc.subject | 부동태 | eng |
dc.subject | SnAgCu | eng |
dc.subject | 신뢰성 | eng |
dc.subject | water-drop test | eng |
dc.subject | 전자패키징 | eng |
dc.subject | anodic polarization test | eng |
dc.subject | passivity | eng |
dc.subject | reliability | eng |
dc.subject | electronic package | eng |
dc.title | Electrochemical migration behavior of Sn-based solder alloys for electronic packaging | eng |
dc.title.alternative | 전자 패키징용 Sn계 솔더 합금의 Electrochemical migration 거동에 관한 연구 | eng |
dc.type | Thesis | - |
dc.contributor.department | 재료공학부 | - |
dc.description.degree | Doctor | eng |
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