SHERP

Implementation of Scanning Tunneling Microscope/Atomic Force Microscope utilizing Length Extension Resonator
길이확장 공진기를 이용한 주사형 터널링/원자간력 현미경의 구현

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Authors
오명철
Advisor
국양
Major
자연과학대학 물리·천문학부(물리학전공)
Issue Date
2014
Publisher
서울대학교 대학원
Keywords
LERLength Extension ResonatorSTMAFMLow temperature preamplifier
Description
학위논문 (석사)-- 서울대학교 대학원 : 물리·천문학부(물리학전공), 2014. 2. 국양.
Abstract
Atomic structure of materials can be resolved with scanning probe microscopy. Atomic Force Microscope (AFM) has been used to observe the geometric structure of microscopic sized sample, i.e. biological specimen, chemical compounds. Meanwhile, Scanning Tunneling Microscope (STM) is widely used to study the electronic structure of conducting materials. However, AFM cannot investigate the electronic structures, and STM forbid non-conducting materials. AFM integrated STM surmounts these shortcomings, by operating different functions of them at the same time. For AFM integrated STM, quartz resonator based AFM can be adopted to implement the system. In this thesis, the Length Extension Resonator (LER), a tiny quartz resonator, is mounted on STM head with an Ir-tip for non-contact mode AFM. Having high stiffness, LER can prevent ‘jump to contact’ effect, and acquire high resolution. For frequency modulation mode AFM operation, Phase Locked Loop (PLL) is used to detect frequency variations. Also, to avoid interference from parasitic capacitances and amplify tiny output signal of LER effectively, home-built low temperature pre-amplifier was fabricated.
Language
English
URI
http://hdl.handle.net/10371/131695
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College of Natural Sciences (자연과학대학)Dept. of Physics and Astronomy (물리·천문학부)Physics (물리학전공)Theses (Master's Degree_물리학전공)
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