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Effect of Substitutional Silicon Dopants on Thermal Properties of Graphene : 실리콘 치환 도핑이 그래핀의 열물성에 미치는 영향

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dc.contributor.advisor고승환-
dc.contributor.author이우림-
dc.date.accessioned2018-11-12T00:56:05Z-
dc.date.available2018-11-12T00:56:05Z-
dc.date.issued2018-08-
dc.identifier.other000000152297-
dc.identifier.urihttps://hdl.handle.net/10371/143094-
dc.description학위논문 (박사)-- 서울대학교 대학원 : 공과대학 기계항공공학부, 2018. 8. 고승환.-
dc.description.abstractOne-atom-thick layer graphene has superlative thermal conductivity k = 2000 ~ 5000 W/mK but it is significantly suppressed by the presence of lattice defects. Among the different types of lattice defects, substitutional defects efficiently reduce the in-plane thermal conductivity but maintain the unique hexagonal structures of graphene, which possibly enables to preserve other novel properties like high electrical mobility and optical transparency. According to the second-order perturbation theory, the phonon scattering rate by the substitutional dopants is known to be proportional to the square of the mass different with the host C atoms (∆M). Previous studies have only demonstrated the thermal conductivity reduction of graphene by the substitutional dopants of small mass difference, including N, 13C, B, and 24C.

In addition, they mostly facilitated the case of small mass perturbation and thermally and atomically isolated suspended graphene. The heavy dopants of larger mass difference will possibly provide more interesting and significant thermal properties alteration in graphene, including by over one order-of-magnitude further reduction in k.

In this point, the selection of our experimental investigation on the thermal properties alteration by substitutional dopants is the silicon atoms, which provides the largest mass difference compared to previous works, in our knowledge. We have successfully synthesized Si-doped graphene (SiG) by using liquid precursor and facilitating the low pressure chemical vapor deposition (LPCVD) synthesis, which suppresses the lattice defects in synthesized graphene samples and thus allows the exclusive understandings on the effects of Si dopants. In addition, the Si doping concentrations indicated by I(D)/I(G) Raman peak ratio are controlled by manipulating the synthesis temperature and pressure. Correlation between the I(D)/I(G) and Si doping concentration enables to measure the in-plane thermal conductivities with the Si doping concentration variation.

The in-plane thermal conductivity (k_SiG) of the supported SiG was probed using optothermal Raman thermometry after being transferred on an ultra-thin 8 nm SiO2 substrate. The measurement results show that k_SiG gradually decreases with the increase of Si dopant mass concentration from 1.41 % to 3.13 %, exhibiting more than one order-of-magnitude reduction from the supported pristine graphene of k = 645.6 ~ 900.2 W/m·K down to k_SiG = 46.7 ~ 79.5 W/m·K for the present supported SiG. When compared to the suspended pristine graphene (PG) case (k = 2662.5 W/m·K), the reduction is accounted for being nearly two order-of-magnitudes. We attribute the observed substantial reduction of k_SiG to the exceptionally large phonon scattering strength of Si dopants, which can be explained by the large mass difference between the doped Si atoms and the C atoms. We have also found that enhancing graphene-substrate conformity through thermal annealing in vacuum further lowers k_SiG from that of the ambient annealing case, due to the increasing phonon scattering rate by underlying substrate. Further aspects in our findings include reduced temperature dependence of k_SiG and negligibly small non-equilibrium effect in Si-doped graphene, both of which are believed to attribute to the enhanced phonon scattering (reduced phonon mean free path) by Si dopants as well as by the presence of the graphene-substrate interface.

Finally, we found that substitutional silicon dopants do not violently destruct the electrical properties of graphene when compared to previously measured thermal conductivities. The measured thermal conductivities show the maximum 8 times further reduction than that of electrical conductivities at about 2.6 % Si doping concentration. This results can be attributable to the resemblance of silicon and carbon atoms in terms of their number of valence electrons. We note that substitutional doping of graphene with heavy Si atoms can be a novel strategy to independently control the thermal properties and thus possibly enhance the thermoelectric efficiency of graphene.
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dc.description.tableofcontentsAbstract i

Contents v

List of Figures viii

List of Tables xvi



Chapter 1. Introduction 1

1.1. Background and motivation 1

1.2. Objective of the study 7



Chapter 2. Synthesis of graphene 13

2.1. Methods for graphene synthesis 13

2.1.1. Pristine graphene 13

2.1.2. Substitutionally doped graphene 16

2.2. Synthesis of Si-doped graphene 19

2.2.1. Review of previous studies 19

2.2.2. Improvement of synthesis recipe 21

2.3. Details in synthesis recipes 23

2.3.1. Recipe for pristine graphene 23

2.3.2. Recipe for Si-doped synthesis 24

2.4. Si doping concentration & homogeneity control 25

2.4.1. Doping concentration 25

2.4.2. Doping homogeneity 27

2.5. Sample characterization 28

2.5.1. Raman spectroscopy 28

2.5.2. X-Ray Photoemission Spectroscopy (XPS) 29

2.5.3. Scanning Electron Microscopy (SEM) 30

2.5.4. Grain size visualization 30

2.6. Summary 31



Chapter 3. Thermal conductivity measurement 46

3.1. Measurement scheme 46

3.2. Sample preparation 48

3.2.1. Why supported graphene? 48

3.2.2. Graphene transfer 49

3.2.3. Thermal annealing 51

3.3. Thermal conductivity measurement 53

3.3.1. Detailed procedure 53

3.3.2. Temperature calibration result 59

3.3.3. Temperature enhancement under heat flux 60

3.4. Summary 61



Chapter 4. Thermal properties of Si-doped graphene 75

4.1. Thermal conductivity reduction 75

4.1.1. Si dopants concentration effect 75

4.1.2. Graphene-substrate conformity effect 81

4.1.3. Grain size effect 83

4.1.4. Doping inhomogeneity effect 84

4.2. Temperature independence of thermal conductivity 86

4.2.1. Si dopants effect 86

4.2.2. Graphene-substrate conformity effect 87

4.3. Non-equilibrium errors in measurement data 88

4.3.1. Why non-equilibrium problems arises? 88

4.3.2. Non-equilibrium error in Si-doped graphene 92

4.4. Summary 94



Chapter 5. Thermoelectric properties of Si-doped graphene 112

5.1. Thermoelecric properties of graphene 112

5.2. Electrical properties of Si-doped graphene 116

5.3. Possibility of ZT enhancment 122

5.4. Summary 126



Chapter 6. Summary and conclusion 135



Reference 139

Abstract in Korean 154
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dc.language.isoen-
dc.publisher서울대학교 대학원-
dc.subject.ddc621-
dc.titleEffect of Substitutional Silicon Dopants on Thermal Properties of Graphene-
dc.title.alternative실리콘 치환 도핑이 그래핀의 열물성에 미치는 영향-
dc.typeThesis-
dc.contributor.AlternativeAuthorLee. Woorim (이우림)-
dc.description.degreeDoctor-
dc.contributor.affiliation공과대학 기계항공공학부-
dc.date.awarded2018-08-
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