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Microscopic investigation of resistive switching in TiO₂thin film using conductive atomic force microscopy
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.advisor | 황철성 | - |
| dc.contributor.author | 신용철 | - |
| dc.date.accessioned | 2009-11-25T02:34:49Z | - |
| dc.date.available | 2009-11-25T02:34:49Z | - |
| dc.date.copyright | 2008. | - |
| dc.date.issued | 2008 | - |
| dc.identifier.uri | http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000041115 | eng |
| dc.identifier.uri | https://hdl.handle.net/10371/14998 | - |
| dc.description | Thesis(masters) --서울대학교 대학원 :재료공학부,2008.2. | eng |
| dc.format.extent | x, 101 p. | eng |
| dc.language.iso | en | - |
| dc.publisher | 서울대학교 대학원 | eng |
| dc.subject | TiO₂ | eng |
| dc.subject | TiO₂ | eng |
| dc.subject | ReRAM | eng |
| dc.subject | ReRAM | eng |
| dc.subject | 저항변화메모리 | eng |
| dc.subject | resistive switching | eng |
| dc.subject | 필라멘트 | eng |
| dc.subject | CAFM | eng |
| dc.subject | CAFM | eng |
| dc.subject | filament | eng |
| dc.title | Microscopic investigation of resistive switching in TiO₂thin film using conductive atomic force microscopy | eng |
| dc.type | Thesis | - |
| dc.contributor.department | 재료공학부 | - |
| dc.description.degree | Master | eng |
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