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(The)Growth characteristics of (Ba,Sr)Tio3 thin films grown near 460℃ using a dome-type MOCVD reactor

DC Field Value Language
dc.contributor.advisor황철성-
dc.contributor.author전충배-
dc.date.accessioned2009-11-25T02:36:11Z-
dc.date.available2009-11-25T02:36:11Z-
dc.date.copyright2006.-
dc.date.issued2006-
dc.identifier.urihttp://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000047486eng
dc.identifier.urihttps://hdl.handle.net/10371/15000-
dc.descriptionThesis(master`s)--서울대학교 대학원 :재료공학부,2006.eng
dc.format.extentxi, 104 leaveseng
dc.language.isoen-
dc.publisher서울대학교 대학원eng
dc.subjectBSTeng
dc.subjectBSTeng
dc.subjectMOCVDeng
dc.subjectMOCVDeng
dc.subject유전율(Deielctric constant)eng
dc.subjectCapacitanceeng
dc.subjectDielectric constanteng
dc.title(The)Growth characteristics of (Ba,Sr)Tio3 thin films grown near 460℃ using a dome-type MOCVD reactoreng
dc.typeThesis-
dc.contributor.department재료공학부-
dc.description.degreeMastereng
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