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Sn계 솔더물질의 electromigration 에서 임계전류밀도 분석 : Threshold current density on electromigration of Sn-based solders
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.advisor | 주영창 | - |
| dc.contributor.author | 김빛나 | - |
| dc.date.accessioned | 2009-11-25T03:02:41Z | - |
| dc.date.available | 2009-11-25T03:02:41Z | - |
| dc.date.copyright | 2007. | - |
| dc.date.issued | 2007 | - |
| dc.identifier.uri | http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000043702 | kor |
| dc.identifier.uri | https://hdl.handle.net/10371/15063 | - |
| dc.description | 학위논문(석사) --서울대학교 대학원 :재료공학부,2007. | kor |
| dc.format.extent | 70 장 | kor |
| dc.language.iso | ko | - |
| dc.publisher | 서울대학교 대학원 | kor |
| dc.subject | electromigration | kor |
| dc.subject | electromigration | kor |
| dc.subject | SnAgCu | kor |
| dc.subject | SnAgCu | kor |
| dc.subject | 공융조성 SnPb | kor |
| dc.subject | eutectic SnPb | kor |
| dc.subject | Blech product | kor |
| dc.subject | Blech product | kor |
| dc.subject | 임계전류밀도 | kor |
| dc.subject | threshold current density | kor |
| dc.title | Sn계 솔더물질의 electromigration 에서 임계전류밀도 분석 | kor |
| dc.title.alternative | Threshold current density on electromigration of Sn-based solders | kor |
| dc.type | Thesis | - |
| dc.contributor.department | 재료공학부 | - |
| dc.description.degree | Master | kor |
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