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Monolithic Three-Dimensional 65-nm CMOS-Nanoelectromechanical Reconfigurable Logic for Sub-1.2-V Operation

Cited 33 time in Web of Science Cited 34 time in Scopus
Authors

Kwon, Hyug Su; Kim, Seung Kyu; Choi, Woo Young

Issue Date
2017-09
Publisher
Institute of Electrical and Electronics Engineers
Citation
IEEE Electron Device Letters, Vol.38 No.9, pp.1317-1320
Abstract
Monolithic three-dimensional (M3D) CMOS-nanoelectromechanical (CMOS-NEM) reconfigurable logic (RL) circuits are experimentally demonstrated. This is the first experimental demonstration of 65-nm M3D CMOS-NEM RL circuits satisfying the 1.2-V supply voltage (VDD) requirement of the 65-nm technology node. The fabrication process is identical to the conventional 65-nm CMOS baseline process, in which copper NEM memory switches are formed by a dual damascene process.
ISSN
0741-3106
URI
https://hdl.handle.net/10371/186770
DOI
https://doi.org/10.1109/LED.2017.2726685
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