Publications

Detailed Information

Esaki-Tunneling-Assisted Tunnel Field-Effect Transistors for Sub-0.7-V Operation

DC Field Value Language
dc.contributor.authorPark, Jong Han-
dc.contributor.authorChoi, Woo Young-
dc.date.accessioned2022-10-26T07:21:27Z-
dc.date.available2022-10-26T07:21:27Z-
dc.date.created2022-10-20-
dc.date.issued2016-10-
dc.identifier.citationJournal of Nanoscience and Nanotechnology, Vol.16 No.10, pp.10237-10240-
dc.identifier.issn1533-4880-
dc.identifier.urihttps://hdl.handle.net/10371/186781-
dc.description.abstractEsaki-tunneling-assisted tunnel field-effect transistors (ETFETs) have been proposed which feature Esaki tunneling at drain-to-base junctions. They have shown lower subthreshold swing (SS) and higher on-current (I-on) than conventional TFETs, which means that ETFETs are attractive solutions to sub-0.7-V operation. It is because the Zener tunneling current induced by the source-to-channel junction is amplified by the embedded heterojunction bipolar transistor (HBT) whose emitter injection is assisted by Esaki tunneling.-
dc.language영어-
dc.publisherAmerican Scientific Publishers-
dc.titleEsaki-Tunneling-Assisted Tunnel Field-Effect Transistors for Sub-0.7-V Operation-
dc.typeArticle-
dc.identifier.doi10.1166/jnn.2016.13134-
dc.citation.journaltitleJournal of Nanoscience and Nanotechnology-
dc.identifier.wosid000387100600013-
dc.identifier.scopusid2-s2.0-84990987667-
dc.citation.endpage10240-
dc.citation.number10-
dc.citation.startpage10237-
dc.citation.volume16-
dc.description.isOpenAccessN-
dc.contributor.affiliatedAuthorChoi, Woo Young-
dc.type.docTypeArticle-
dc.description.journalClass1-
Appears in Collections:
Files in This Item:
There are no files associated with this item.

Altmetrics

Item View & Download Count

  • mendeley

Items in S-Space are protected by copyright, with all rights reserved, unless otherwise indicated.

Share