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Compact Diode Connected MOSFET Detector for On-Chip Millimeter-Wave Voltage Measurements
Cited 5 time in
Web of Science
Cited 6 time in Scopus
- Authors
- Issue Date
- 2016-05
- Citation
- IEEE Microwave and Wireless Components Letters, Vol.26 No.5, pp.349-351
- Abstract
- A root-mean-square diode connected MOSFET detector for estimating the signal voltage of internal nodes of millimeter-wave circuits is demonstrated. These detectors fabricated in a foundry 65 nm CMOS process provide an affordable means for RF testing, built-in self-test as well as debugging of mm-wave circuits. This broadband detector operates from 80-110 GHz with detector gain of 8.5 V-1 at 60 nA bias. This in combination with high input impedance that results in less than 0.15 dB insertion loss relative to a thru structure, and a small area of 20 mu m(2) makes the detector non-invasive.
- ISSN
- 1531-1309
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Related Researcher
- College of Engineering
- Department of Electrical and Computer Engineering
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