Publications

Detailed Information

An embedded 8-bit RISC controller for yield enhancement of the 90-nm PRAM

Cited 1 time in Web of Science Cited 0 time in Scopus
Authors

Kim, Hyejung; Sohn, Kyornin; Yoo, Jerald; Yoo, Hoi-Jun

Issue Date
2007-09
Publisher
IEEE
Citation
PROCEEDINGS OF THE IEEE 2007 CUSTOM INTEGRATED CIRCUITS CONFERENCE, p. 4405847
Abstract
An embedded 8b RISC for advanced memories is designed to control, analyze and optimize the memory timing and voltage parameters. The processor-based built-in-self-optimize (BISO) algorithm is proposed to enhance the memory yield. A test PRAM with the RISC is fabricated in 90nm, 3-metal diode-switch process. By applying BISO, the PRAM margin window increases by 221%. It operates at 100MHz and consumes 28.4mW at 1.0V supply voltage. The embedded RISC enables 100Mb/s/pin read/write throughputs to PRAM.
URI
https://hdl.handle.net/10371/200872
Files in This Item:
There are no files associated with this item.
Appears in Collections:

Related Researcher

Yoo, Jerald Image

Yoo, Jerald유담
부교수
  • College of Engineering
  • Department of Electrical and Computer Engineering
Research Area Biomedical Applications, Energy-Efficient Integrated Circuits

Altmetrics

Item View & Download Count

  • mendeley

Items in S-Space are protected by copyright, with all rights reserved, unless otherwise indicated.

Share