Browse

Issue Date

Jump to a point in the index
Or type in a year
  • Sort by
  • In order
  • Results/Page
  • Authors/record

Showing results 101 to 120 of 2,171

Issue DateTitle / Author(s) / CitationFileAltmetrics
2023-01DOI
2023-01DOI
2023-01DOI
2023DOI
2022-12DOI
2022-12

Kim, Minsoo; Kim, Hyunjae; Kim, Inwoo; Chang, Barsa; Choi, Jang Wook

Proceedings of the National Academy of Sciences of the United States of America, Vol.119 No.51, p. 2211436119

DOI
2022-12

Choi, Jang Wook; Yao, Yan

Current Opinion in Electrochemistry, Vol.36, p. 101157

DOI
2022-12

Ryu, Jina; Yang, Sung Jae; Son, Boram; Lee, Haein; Lee, Jongmin; Joo, Jinmyoung; Park, Hee Ho; Park, Tai Hyun

Artificial Cells, Nanomedicine and Biotechnology, Vol.50 No.1, pp.278-285

DOI
2022-12

Yoon, Jinsoo; Kim, Joohyun; Lee, Juri; Hong, Sung Pil; Park, Soomin; Jeong, Yong Won; Lee, Changha; Oh, Seong-Geun

Journal of Industrial and Engineering Chemistry, Vol.116, pp.572-580

DOI
2022-12

Deng, Guocheng; Lee, Kangjae; Deng, Hongwen; Bootharaju, Megalamane S.; Zheng, Nanfeng; Hyeon, Taeghwan

Journal of Physical Chemistry C, Vol.126 No.48, pp.20577-20583

DOI
2022-12

Deng, Guocheng; Kim, Jimin; Bootharaju, Megalamane S.; Sun, Fang; Lee, Kangjae; Tang, Qing; Hwang, Yun Jeong; Hyeon, Taeg Hwan

Journal of the American Chemical Society, Vol.145 No.6, pp.3401-3407

DOI
2022-12

Kim, Su-Hwan; Shin, Kwangsoo; Kim, Byung-Gee; Hwang, Nathaniel S. S.; Hyeon, Taeghwan

Chemical Communications, Vol.59 No.1, pp.94-97

DOI
2022-12DOI
2022-11DOI
2022-11DOI
2022-11

Lee, Haein; Park, Geunhwa; Kim, Seulha; Son, Boram; Joo, Jinmyoung; Park, Hee Ho; Park, Tai Hyun

Applied Microbiology and Biotechnology, Vol.106 No.22, pp.7531-7545

DOI
2022-11

Kim, Minkwan K.; Shin, Seung-Jae; Lee, Jimin M.; Park, Youngbin B.; Kim, Yangmoon M.; Kim, Hyungjun J.; Choi, Jang Wook

Angewandte Chemie - International Edition, Vol.61 No.47, p. e202211589

DOI
2022-11DOI
2022-11DOI
2022-11

Jeong, Seonghun; Park, So Young; So, Bihong; Lee, Kyu Tae; Park, Yeong Don; Mun, Junyoung

Chemical Engineering Journal, Vol.448, p. 137654

DOI