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Issue DateTitle / Author(s) / CitationFileAltmetrics
2016-04

Joe, Sung-Min; Kang, Ho-Jung; Choi, Nagyong; Kang, Myounggon; Park, Byung-Gook; Lee, Jong-Ho

IEEE Transactions on Electron Devices, Vol.63 No.4, pp.1533-1538

DOI
1