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Issue DateTitle / Author(s) / CitationFileAltmetrics
2019-12

Kim, Juyeop; Lim, Younghyun; Yoon, Heein; Lee, Yongsun; Park, Hangi; Cho, Yoonseo; Seong, Taeho; Choi, Jaehyouk

IEEE JOURNAL OF SOLID-STATE CIRCUITS, Vol.54 No.12, pp.3466-3477

DOI
1