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Issue Date	Title / Author(s) / Citation	File
2016-06	Semi-supervised support vector regression based on self-training with label uncertainty: An application to virtual metrology in semiconductor manufacturing Kang, Pilsung; Kim, Dongil; Cho, Sungzoon Expert Systems with Applications, Vol.51, pp.85-106	DOI
2017	Machine learning-based anomaly detection via integration of manufacturing, inspection and after-sales service data Ko, Taehoon; Lee, Je Hyuk; Cho, Hyunchang; Cho, Sungzoon; Lee, Wounjoo; Lee, Miji Industrial Management and Data Systems, Vol.117 No.5, pp.927-945	DOI
2018-11	Applying convolution filter to matrix of word-clustering based document representation Lee, Younghoon; Im, Jinbae; Cho, Sungzoon; Choi, Jinhae Neurocomputing, Vol.315, pp.210-220	DOI