Test of variance change in a long-memory process

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Test of variance change in a long-memory process : 장기기억과정에서의 분산변화검정

DC Field	Value	Language
dc.contributor.advisor	조신섭	-
dc.contributor.author	주민정	-
dc.date.accessioned	2010-01-18T08:17:26Z	-
dc.date.available	2010-01-18T08:17:26Z	-
dc.date.copyright	2001.	-
dc.date.issued	2001	-
dc.identifier.uri	http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000063284	eng
dc.identifier.uri	https://hdl.handle.net/10371/36946	-
dc.description	Thesis (doctoral)--서울대학교 대학원 :통계학과,2001.	en
dc.format.extent	v, 102 p.	en
dc.language.iso	en	en
dc.publisher	서울대학교 대학원	en
dc.subject	long-memory process	en
dc.subject	장기기억과정	en
dc.subject	short-memory process	en
dc.subject	단기기억과정	en
dc.subject	strong reduction theorem	en
dc.subject	강한 축소 정리	en
dc.subject	chang-point	en
dc.subject	분산변화점	en
dc.subject	cusum of squares	en
dc.subject	누적제곱합	en
dc.title	Test of variance change in a long-memory process	en
dc.title.alternative	장기기억과정에서의 분산변화검정	-
dc.type	Thesis	-
dc.contributor.department	통계학과	-
dc.description.degree	Doctor	en

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