Temporal noise analysis and reduction method in CMOS image sensor readout circuit

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Temporal noise analysis and reduction method in CMOS image sensor readout circuit : CMOS image sensor readout 회로의 temporal 잡음 분석과 감소 방법

DC Field	Value	Language
dc.contributor.advisor	신형철	-
dc.contributor.author	김봉찬	-
dc.date.accessioned	2010-01-26T09:56:34Z	-
dc.date.available	2010-01-26T09:56:34Z	-
dc.date.copyright	2009.	-
dc.date.issued	2009	-
dc.identifier.uri	http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000037008	eng
dc.identifier.uri	https://hdl.handle.net/10371/44879	-
dc.description	Thesis(masters) --서울대학교 대학원 :전기. 컴퓨터공학부, 2009.2.	en
dc.format.extent	iv, 42 leaves	en
dc.language.iso	en	en
dc.publisher	서울대학교 대학원	en
dc.subject	CMOS image sensor readout 회로	en
dc.subject	CMOS image sensor readout circuit	en
dc.subject	Correlated double sampling	en
dc.subject	Correlated double sampling	en
dc.subject	저주파 잡음 (1/f 잡음과 RTN)	en
dc.subject	Low frequency noise(1/f noise and RTN)	en
dc.subject	잡음 감소	en
dc.subject	Noise reduction	en
dc.subject	잡음 전달 함수	en
dc.subject	Noise transfer function	en
dc.subject	열 잡음	en
dc.subject	Thermal noise	en
dc.title	Temporal noise analysis and reduction method in CMOS image sensor readout circuit	en
dc.title.alternative	CMOS image sensor readout 회로의 temporal 잡음 분석과 감소 방법	en
dc.type	Thesis	-
dc.contributor.department	전기. 컴퓨터공학부	-
dc.description.degree	Master	en

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