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자가참조에 기반한 복수패턴 wafer의 불량 검출
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.advisor | 유석인 | - |
| dc.contributor.author | 김병민 | - |
| dc.date.accessioned | 2010-01-26T09:56:37Z | - |
| dc.date.available | 2010-01-26T09:56:37Z | - |
| dc.date.copyright | 2009. | - |
| dc.date.issued | 2009 | - |
| dc.identifier.uri | http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000037007 | kog |
| dc.identifier.uri | https://hdl.handle.net/10371/44880 | - |
| dc.description | 학위논문(석사) --서울대학교 대학원 :전기. 컴퓨터공학부, 2009.2. | ko |
| dc.format.extent | 32장 | ko |
| dc.language.iso | ko | ko |
| dc.publisher | 서울대학교 대학원 | ko |
| dc.subject | 불량 검출 | ko |
| dc.subject | Defect detection | ko |
| dc.subject | 반도체 | ko |
| dc.subject | Semiconductor | ko |
| dc.subject | Wafer | ko |
| dc.subject | Wafer | ko |
| dc.subject | Non-referential | ko |
| dc.subject | Non-referential | ko |
| dc.subject | Gaussian Mixture Model | ko |
| dc.subject | Gaussian Mixture Model | ko |
| dc.subject | Thresholding | ko |
| dc.subject | Thresholding | ko |
| dc.title | 자가참조에 기반한 복수패턴 wafer의 불량 검출 | ko |
| dc.type | Thesis | - |
| dc.contributor.department | 전기. 컴퓨터공학부 | - |
| dc.description.degree | Master | ko |
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