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Electrical characteristics of silicon nanowires with scanning force microscope : 원자간력 현미경을 이용한 실리콘 나노선의 전기적 특성에 관한 연구
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.advisor | 국양 | - |
| dc.contributor.author | 박용대 | - |
| dc.date.accessioned | 2010-01-28T09:15:08Z | - |
| dc.date.available | 2010-01-28T09:15:08Z | - |
| dc.date.copyright | 2008. | - |
| dc.date.issued | 2008 | - |
| dc.identifier.uri | http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000039356 | eng |
| dc.identifier.uri | https://hdl.handle.net/10371/46378 | - |
| dc.description | Thesis(doctors)--서울대학교 대학원 :물리학부,2008.2. | en |
| dc.format.extent | v, 95, ii p. | en |
| dc.language.iso | en | en |
| dc.publisher | 서울대학교 대학원 | en |
| dc.subject | 실리콘 나노선 | en |
| dc.subject | silicon nanowire | en |
| dc.subject | SLS(solid-liquid-solid)성장법 | en |
| dc.subject | SLS(solid-liquid-solid) | en |
| dc.subject | 양자섬 | en |
| dc.subject | quantum dot | en |
| dc.subject | 주사 게이트 현미경 | en |
| dc.subject | Scanning Gate Microscopy | en |
| dc.subject | 정전기력 현미경 | en |
| dc.subject | Electrostatic Force Microscopy | en |
| dc.title | Electrical characteristics of silicon nanowires with scanning force microscope | en |
| dc.title.alternative | 원자간력 현미경을 이용한 실리콘 나노선의 전기적 특성에 관한 연구 | en |
| dc.type | Thesis | - |
| dc.contributor.department | 물리학부 | - |
| dc.description.degree | Doctor | en |
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