Browse

Thickness dependence of the melting temperature in thin polymer films

Cited 0 time in Web of Science Cited 0 time in Scopus
Authors
Jang, Jyongsik; Kim, Jae Hyun; Zin, Wang-Cheol
Issue Date
2001
Publisher
Wiley-Blackwell
Citation
Macromol. Rapid Commun. 2001, 22, 386
Abstract
The melting temperature (Tm) of thin
poly[ethylene-co-(vinyl acetate)] films coated on a silicon
wafer was investigated. Ellipsometry was used to measure
the Tm which was found to decrease dramatically when
the thickness of the film is less than 300 A°
. The relationship
between the lamellar thickness and the Tm was
thought to be responsible this thickness dependence of the
Tm in thin polymer films.
ISSN
1022-1336
Language
English
URI
http://www3.interscience.wiley.com/journal/78505167/abstract

http://hdl.handle.net/10371/49111
Files in This Item:
There are no files associated with this item.
Appears in Collections:
Student's Archives (학생저작물)Student's WorksGraduated, Researcher (석·박사, 연구생)
  • mendeley

Items in S-Space are protected by copyright, with all rights reserved, unless otherwise indicated.

Browse