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Carrier density dynamics in semiconductors and oxides studied by scanning capactiance microscopy : 주사형 전기용량 현미경을 이용한 반도체와 산화막 내의 동역학적 전하거동 연구
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.advisor | 국양 | - |
| dc.contributor.author | 강치중 | - |
| dc.date.accessioned | 2010-02-22 | - |
| dc.date.available | 2010-02-22 | - |
| dc.date.copyright | 1998. | - |
| dc.date.issued | 1998 | - |
| dc.identifier.uri | http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000076298 | eng |
| dc.identifier.uri | https://hdl.handle.net/10371/55885 | - |
| dc.description | Thesis (doctoral)--서울대학교 대학원 :물리학과,1998. | en |
| dc.format.extent | viii, 108 p. | en |
| dc.language.iso | en | en |
| dc.publisher | 서울대학교 대학원 | en |
| dc.subject | 주사형 전기용량 현미경(SCM) | en |
| dc.subject | scanning capacitance microscopy (SCM) | en |
| dc.subject | S-V | en |
| dc.subject | dopant profile | en |
| dc.subject | 불순물 농도 분포 | en |
| dc.subject | electron and hole trap | en |
| dc.subject | 전하트랩 | en |
| dc.subject | detrapping dynamics | en |
| dc.subject | 동역학적 전하 거동 | en |
| dc.title | Carrier density dynamics in semiconductors and oxides studied by scanning capactiance microscopy | en |
| dc.title.alternative | 주사형 전기용량 현미경을 이용한 반도체와 산화막 내의 동역학적 전하거동 연구 | - |
| dc.type | Thesis | - |
| dc.contributor.department | 물리학과 | - |
| dc.description.degree | Doctor | en |
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