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Origin of cathodic degradation and new phase formation at the La0.9Sr0.1MnO3/YSZ interface

DC Field Value Language
dc.contributor.authorLee, Hee Y.-
dc.contributor.authorOh, Seung M.-
dc.date.accessioned2009-07-16-
dc.date.available2009-07-16-
dc.date.issued1999-02-12-
dc.identifier.citationSolid State Ionics 90 (1996) 133en
dc.identifier.issn0167-2738-
dc.identifier.urihttps://hdl.handle.net/10371/5649-
dc.description.abstractNew phase formation at the La0.9Sr0.1MnO3/YSZ interface and its effects on the cathodic performances were studied at 900 °C in air. The resistance caused by the interfacial product layer kept increasing with time to reach up to 40% of the total resistance after 500 h. The interfacial product was identified as La2Zr2O7 by XRD measurement. The electrical conductivity of La2Zr2O7 (2.4 × 10−5 S cm−1 at 1000 °C), measured by AC impedance and current interruption methods, was 4 to 7 orders of magnitude smaller than those of La0.9Sr0.1MnO3 electrode or YSZ electrolyte. Either the electronic conductivity or the electrochemical O2 reduction activity of La2Zr2O7 was negligible. Combining these results, a conclusion was made that the cathodic degradation comes mainly from the growth of interfacial product layer and its contribution to the cell resistance increment is ohmic in nature.en
dc.description.sponsorshipFundings for this work were provided by the Ssang Yong Cement Industrial Co. (Korea).en
dc.language.isoenen
dc.publisherElsevieren
dc.subjectLanthanum zirconateen
dc.subjectCathode degradation in SOFCen
dc.subjectOhmic lossesen
dc.subjectAC impedanceen
dc.subjectCurrent interruptionen
dc.titleOrigin of cathodic degradation and new phase formation at the La0.9Sr0.1MnO3/YSZ interfaceen
dc.typeArticleen
dc.contributor.AlternativeAuthor이희영-
dc.contributor.AlternativeAuthor오승모-
dc.identifier.doi10.1016/S0167-2738(96)00408-0-
dc.citation.journaltitleSolid State Ionics-
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