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Width dependence of median time to failure and temperature dependence of threshold current density in electromigration : electromigration에서 평균 단선시간의 너비 의존성과 문턱전류밀도의 온도 의존성
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- Authors
- Advisor
- 이홍희
- Issue Date
- 1997
- Publisher
- 서울대학교 대학원
- Description
- Thesis (master`s)--서울대학교 대학원 :화학공학과,1997.
- Language
- English
- URI
- http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000077124
https://hdl.handle.net/10371/58991
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