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A Multi-Mode Power Gating Structure for Low-Voltage Deep-Submicron CMOS ICs

DC Field Value Language
dc.contributor.authorKim, Suhwan-
dc.contributor.authorStephen V., Kosonocky-
dc.contributor.authorDaniel R, Knebel-
dc.contributor.authorKevin, Stawiasz-
dc.contributor.authorMarios C, Papaefthymiou-
dc.date.accessioned2010-06-29T23:55:26Z-
dc.date.available2010-06-29T23:55:26Z-
dc.date.issued2007-07-
dc.identifier.citationIEEE Transactions on Circuits and Systems Part 2 Express Briefs, vol. 54, no. 7, pp. 586-590en
dc.identifier.issn1549-7747-
dc.identifier.urihttps://hdl.handle.net/10371/68015-
dc.description.abstractMost existing power gating structures provide only
one power-saving mode. We propose a novel power gating structure
that supports both a cutoff mode and an intermediate powersaving
and data-retaining mode. Experiments with test structures
fabricated in 0.13- mCMOSbulk technology showthat our power
gating structure yields an expanded design space with more powerperformance
tradeoff alternatives.
en
dc.language.isoenen
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en
dc.subjectDeep-submicrometer CMOSen
dc.subjectground bounce noiseen
dc.subjectlow voltageen
dc.subjectmulti-threshold CMOS (MTCMOS)en
dc.titleA Multi-Mode Power Gating Structure for Low-Voltage Deep-Submicron CMOS ICsen
dc.typeArticleen
dc.contributor.AlternativeAuthor김수환-
dc.identifier.doi10.1109/TCSII.2007.894428-
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