Publications
Detailed Information
Business planning based on technological capabilities: Patent analysis for technology-driven roadmapping
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, Sungjoo | - |
dc.contributor.author | Yoon, Byungun | - |
dc.contributor.author | Lee, Changyong | - |
dc.contributor.author | Park, Jinwoo | - |
dc.date.accessioned | 2012-03-05T02:31:20Z | - |
dc.date.available | 2012-03-05T02:31:20Z | - |
dc.date.issued | 2009-07-01 | - |
dc.identifier.citation | TECHNOLOGICAL FORECASTING AND SOCIAL CHANGE; Vol.76 6; 769-786 | - |
dc.identifier.issn | 0040-1625 | - |
dc.identifier.uri | https://hdl.handle.net/10371/75349 | - |
dc.description.abstract | This research responds to the needs of technology-driven business by focusing on how firms can find new business opportunities based on their technological capabilities. It proposes a technology-driven roadmapping processes that starts from capability analysis for technology planning and ends with business opportunity analysis for market planning. We Suggest the use of patent data as a proxy measure of technological capability for this purpose and develop four analysis modules - Monitoring, Collaboration, Diversification, and Benchmarking - to support decision-making during the process. Various analysis techniques such as text-mining, network analysis, citation analysis and index analysis are applied to discover meaningful implications from the patent data. which are summarized in four maps - Actor-similarity map, Actor-relations map, Technology-industry map, and Technology-affinity map. For the purpose of illustration, RFID-related patents are collected and the 18 firms with the most patents used, focusing especially on the third biggest. We believe using roadmapping and patent analysis together can play complementary roles for each other. Putting roadmapping techniques together with patent analysis can increase the objectivity and reliability of technology roadmap, while using patent analysis restricted to technological information together with roadmapping techniques can ensure that a more Valuable breadth of strategic information is extracted from patents. (C) 2009 Elsevier Inc. All rights reserved. | - |
dc.language.iso | en | - |
dc.publisher | ELSEVIER SCIENCE INC | - |
dc.subject | Technology roadmap | - |
dc.subject | Patent analysis | - |
dc.subject | Text-mining | - |
dc.subject | Roadmapping | - |
dc.subject | Network analysis | - |
dc.subject | RFID | - |
dc.subject | Citation analysis | - |
dc.title | Business planning based on technological capabilities: Patent analysis for technology-driven roadmapping | - |
dc.type | Article | - |
dc.contributor.AlternativeAuthor | 이성주 | - |
dc.contributor.AlternativeAuthor | 윤병근 | - |
dc.contributor.AlternativeAuthor | 이창용 | - |
dc.contributor.AlternativeAuthor | 박진우 | - |
dc.identifier.doi | 10.1016/j.techfore.2009.01.003 | - |
dc.citation.journaltitle | TECHNOLOGICAL FORECASTING AND SOCIAL CHANGE | - |
dc.description.citedreference | Chang SB, 2009, TECHNOL FORECAST SOC, V76, P107, DOI 10.1016/j.techfore.2008.03.014 | - |
dc.description.citedreference | YOON B, 2008, DAT MIN APPR WSEA C | - |
dc.description.citedreference | LEE S, 2008, R&D MANAGE, V38, P166 | - |
dc.description.citedreference | Choi C, 2007, TECHNOL FORECAST SOC, V74, P1296, DOI 10.1016/j.techfore.2006.10.008 | - |
dc.description.citedreference | Fujii A, 2007, INFORM PROCESS MANAG, V43, P1149, DOI 10.1016/j.ipm.2006.11.004 | - |
dc.description.citedreference | Tseng YH, 2007, INFORM PROCESS MANAG, V43, P1216, DOI 10.1016/j.ipm.2006.11.011 | - |
dc.description.citedreference | Lee S, 2007, TECHNOVATION, V27, P433, DOI 10.1016/j.technovation.2007.02.011 | - |
dc.description.citedreference | Asan SS, 2007, TECHNOL FORECAST SOC, V74, P627, DOI 10.1016/j.techfore.2006.05.011 | - |
dc.description.citedreference | Ngai EWT, 2007, DECIS SUPPORT SYST, V43, P62, DOI 10.1016/j.dss.2005.05.006 | - |
dc.description.citedreference | Kostoff RN, 2006, TECHNOL FORECAST SOC, V73, P923, DOI 10.1016/j.techfore.2005.09.004 | - |
dc.description.citedreference | Becker HA, 2006, TECHNOL FORECAST SOC, V73, P966, DOI 10.1016/j.techfore.2006.01.008 | - |
dc.description.citedreference | Criscuolo P, 2006, SCIENTOMETRICS, V66, P23, DOI 10.1007/s11192-006-0003-6 | - |
dc.description.citedreference | NAKAMURA K, 2006, P 2006 PICMET PORTL | - |
dc.description.citedreference | Galbreath J, 2005, TECHNOVATION, V25, P979, DOI 10.1016/j.technovation.2004.02.008 | - |
dc.description.citedreference | Lee S, 2005, TECHNOL FORECAST SOC, V72, P567, DOI 10.1016/j.techfore.2004.11.006 | - |
dc.description.citedreference | PARK Y, 2005, TECHNOL SOC, V27, P471 | - |
dc.description.citedreference | PHAAL R, 2005, P 2005 PICMET PORTL | - |
dc.description.citedreference | YOON B, 2004, J HIGH TECHNOLOGY MA, V15, P37 | - |
dc.description.citedreference | Phaal R, 2004, TECHNOL FORECAST SOC, V71, P5, DOI 10.1016/S0040-1625(03)00072-6 | - |
dc.description.citedreference | Petrick IJ, 2004, TECHNOL FORECAST SOC, V71, P81, DOI 10.1016/S0040-1625(03)00064-7 | - |
dc.description.citedreference | Rinne M, 2004, TECHNOL FORECAST SOC, V71, P67, DOI 10.1016/j.techfore.2003.10.002 | - |
dc.description.citedreference | Kostoff RN, 2004, TECHNOL FORECAST SOC, V71, P141, DOI 10.1016/S0040-1625(03)00048-9 | - |
dc.description.citedreference | Walsh ST, 2004, TECHNOL FORECAST SOC, V71, P161, DOI 10.1016/j.techfore.2003.10.003 | - |
dc.description.citedreference | Vojak BA, 2004, TECHNOL FORECAST SOC, V71, P121, DOI 10.1016/S0040-1625(03)00047-7 | - |
dc.description.citedreference | Saritas O, 2004, TECHNOL FORECAST SOC, V71, P27, DOI 10.1016/S0040-1625(03)00067-2 | - |
dc.description.citedreference | MOEHRLE MG, 2004, INT J TECHNOL INTELL, V1, P87 | - |
dc.description.citedreference | LIZASO F, 2004, INT J TECHNOL INTELL, V1, P68 | - |
dc.description.citedreference | Hu AGZ, 2003, INT J IND ORGAN, V21, P849, DOI 10.1016/S0167-7187(03)00035-3 | - |
dc.description.citedreference | Albright RE, 2003, RES TECHNOL MANAGE, V46, P31 | - |
dc.description.citedreference | ERNST H, 2003, WORLD PATENT INFORM, V25, P233, DOI 10.1016/S0172-2190(03)00077-2 | - |
dc.description.citedreference | PHAAL R, 2003, P PICMET 03 PORTL | - |
dc.description.citedreference | YEAP T, 2003, P INT C MEMS NANO SM, P274 | - |
dc.description.citedreference | KOSTER C, 2003, P 25 EUR C INF RETR, P161 | - |
dc.description.citedreference | Yoon BU, 2002, R&D MANAGE, V32, P291 | - |
dc.description.citedreference | Verbeek A, 2002, SCIENTOMETRICS, V54, P399 | - |
dc.description.citedreference | KRIER M, 2002, WORLD PATENT INFORMA, V24, P187 | - |
dc.description.citedreference | Watanabe C, 2001, TECHNOVATION, V21, P783 | - |
dc.description.citedreference | Henard DH, 2001, J MARKETING RES, V38, P362 | - |
dc.description.citedreference | Kostoff RN, 2001, IEEE T ENG MANAGE, V48, P132, DOI 10.1109/17.922473 | - |
dc.description.citedreference | HIRSCHEY M, 2001, PACIFIC BASIN FINANC, V9, P65 | - |
dc.description.citedreference | Tijssen RJW, 2001, RES POLICY, V30, P35 | - |
dc.description.citedreference | Brown P, 2001, EMERG INFECT DIS, V7, P6 | - |
dc.description.citedreference | HU AGZ, 2001, 8528 NBER | - |
dc.description.citedreference | LARKEY LS, 1999, P DL 99 4 ACM C DIG, P179 | - |
dc.description.citedreference | JAFFE AB, 1999, EC INNOVATION NEW TE, V8, P105 | - |
dc.description.citedreference | Meyer-Krahmer F, 1998, RES POLICY, V27, P835 | - |
dc.description.citedreference | Ernst H, 1998, J ENG TECHNOL MANAGE, V15, P279 | - |
dc.description.citedreference | GARCIA ML, 1998, FUNDAMENTALS TECHNOL | - |
dc.description.citedreference | JAFFE AB, 1998, REV ECON STAT, V70, P431 | - |
dc.description.citedreference | DRUCKER PF, 1998, DISCIPLINE INNOVATIO, P149 | - |
dc.description.citedreference | Groenveld P, 1997, RES TECHNOL MANAGE, V40, P48 | - |
dc.description.citedreference | Patel P, 1997, RES POLICY, V26, P141 | - |
dc.description.citedreference | KARKI MMS, 1997, WORLD PATENT INFORMA, V19, P269 | - |
dc.description.citedreference | MICHALISIN MD, 1997, INT J ORG ANAL, V5, P360 | - |
dc.description.citedreference | ARCHIBUGI D, 1996, PATENTS TECHNOLOGIES | - |
dc.description.citedreference | BARKER D, 1995, LONG RANGE PLANN, V28, P21 | - |
dc.description.citedreference | ALI A, 1995, J PROD INNOVAT MANAG, V12, P54 | - |
dc.description.citedreference | *OECD, 1994, PAT MAN CD, P114 | - |
dc.description.citedreference | AMIT R, 1993, STRATEGIC MANAGE J, V14, P33 | - |
dc.description.citedreference | NARIN F, 1992, RES POLICY, V21, P237 | - |
dc.description.citedreference | MOGEE M, 1991, RES TECHNOL MANAGE, V4, P43 | - |
dc.description.citedreference | COLLINS P, 1988, RES POLICY, V17, P65 | - |
dc.description.citedreference | WILLYARD CH, 1987, RES MANAGE, V30, P13 | - |
dc.description.citedreference | NARIN F, 1987, RES POLICY, V16, P143 | - |
dc.description.citedreference | SCHERER FM, 1981, R D PATENTS PRODUCTI, P417 | - |
dc.description.tc | 12 | - |
dc.identifier.wosid | 000267632800005 | - |
- Appears in Collections:
- Files in This Item:
- There are no files associated with this item.
Item View & Download Count
Items in S-Space are protected by copyright, with all rights reserved, unless otherwise indicated.