SHERP

Sensitivity Enhancement of Surface Plasmon Resonance Imaging Using Periodic Metallic Nanowires

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Authors
Byun, Kyung Min; Shuler, Michael L.; Kim, Sung June; Yoon, Soon Joon; Kim, Donghyun
Issue Date
2008-06
Publisher
IEEE Institute of Electrical and Electronics
Citation
J. Lightwave Technology, vol. 26, no. 11, pp. 1472-1478, Jun. 2008
Keywords
Imagingmetallic nanowiresoptical sensorssensitivitysurface plasmons
Abstract
A nanowire-mediated surface plasmon resonance
(SPR) imaging is numerically investigated for enhanced sensitivity.
The results calculated by rigorous coupled-wave analysis
present that interplays between localized surface plasmons and
surface plasmon polaritons contribute to sensitivity enhancement.
Compared to conventional thin film-based SPR imaging measurement,
an optimal nanowire structure can provide sensitivity
enhancement by 3.44 times as well as highly linear detection property
for quantification of surface reactions of interests. This paper
demonstrates the potential and limitation for a highly sensitive,
label-free, and real-time SPR imaging sensor based on periodic
metallic nanowires.
ISSN
0733-8724
Language
English
URI
http://hdl.handle.net/10371/7843
DOI
https://doi.org/10.1109/JLT.2008.922182
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College of Engineering/Engineering Practice School (공과대학/대학원)Dept. of Electrical and Computer Engineering (전기·정보공학부)Journal Papers (저널논문_전기·정보공학부)
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