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Showing results 1 to 6 of 6

Issue Date	Title / Author(s) / Citation	File
2009-12	A virtual metrology system for semiconductor manufacturing Kang, Pilsung; Lee, Hyoung-joo; Cho, Sungzoon; Kim, Dongil; Park, Chan-Kyoo; Doh, Seungyong; Park, Jinwoo EXPERT SYSTEMS WITH APPLICATIONS; Vol.36 10; 12554-12561	DOI
2011-03	Virtual metrology for run-to-run control in semiconductor manufacturing Kang, Pilsung; Kim, Dongil; Lee, Hyoung-joo; Doh, Seungyong; Cho, Sungzoon EXPERT SYSTEMS WITH APPLICATIONS; Vol.38 3; 2508-2522	DOI
2016-06	Semi-supervised support vector regression based on self-training with label uncertainty: An application to virtual metrology in semiconductor manufacturing Kang, Pilsung; Kim, Dongil; Cho, Sungzoon Expert Systems with Applications, Vol.51, pp.85-106	DOI
2016-11	Efficient Feature Selection-Based on Random Forward Search for Virtual Metrology Modeling Kang, Seokho; Kim, Dongil; Cho, Sungzoon IEEE Transactions on Semiconductor Manufacturing, Vol.29 No.4, pp.391-398	DOI
2019-04	Approximate training of one-class support vector machines using expected margin Kang, Seokho; Kim, Dongil; Cho, Sungzoon Computers and Industrial Engineering, Vol.130, pp.772-778	DOI
2020-01	Expected margin-based pattern selection for support vector machines Kim, Dongil; Kang, Seokho; Cho, Sungzoon Expert Systems with Applications, Vol.139, p. 112865	DOI