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Issue Date	Title / Author(s) / Citation	File	Altmetrics
2019-02	Depth from a Light Field Image with Learning-Based Matching Costs Jeon, Hae-Gon; Park, Jaesik; Choe, Gyeongmin; Park, Jinsun; Bok, Yunsu; Tai, Yu-Wing; Kweon, In So IEEE Transactions on Pattern Analysis and Machine Intelligence, Vol.41 No.2, pp.297-310	DOI