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Issue DateTitle / Author(s) / CitationFileAltmetrics
2012

Yoo, Jerald; Yan, Long; El-Damak, Dina; Altaf, Muhammad Bin; Shoeb, Ali; Yoo, Hoi-Jun; Chandrakasan, Anantha

Digest of Technical Papers - IEEE International Solid-State Circuits Conference, Vol.55, pp.292-293

DOI
1