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Issue Date	Title / Author(s) / Citation	File	Altmetrics
2021-01	An In-Depth I/O Pattern Analysis in HPC Systems Bang, Jiwoo; Kim, Chungyong; Wu, Kesheng; Sim, Alex; Byna, Suren; Sung, Hanul; Eom, Hyeonsang Proceedings - 2021 IEEE 28th International Conference on High Performance Computing, Data, and Analytics, HiPC 2021, pp.400-405	DOI