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Issue Date	Title / Author(s) / Citation	File	Altmetrics
2023	Tailoring CUTLASS GEMM using Supervised Learning Yu, Yongseung; Son, Donghyun; Lee, Younghyun; Park, Sunghyun; Ryu, Giha; Cho, Myeongjin; Seo, Jiwon; Park, Yongjun IEEE International Conference on Computer Design - VLSI in Computers and Processors, pp.465-474	DOI
2024	Discovering Efficient Fused Layer Configurations for Executing Multi-Workloads on Multi-core NPUs Lee, Younghyun; Kim, Hyejun; Yu, Yongseung; Cho, Myeongjin; Seo, Jiwon; Park, Yongjun 2024 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION, DATE	DOI