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Issue DateTitle / Author(s) / CitationFileAltmetrics
2022-03

D. Akimov; P. An; C. Awe; P.S. Barbeau; B. Becker; V. Belov; I. Bernardi; M.A. Blackston; C. Bock; A. Bolozdynya; J. Browning; B. Cabrera-Palmer; D. Chernyak; E. Conley; J. Daughhetee; J. Detwiler; K. Ding; M.R. Durand; Y. Efremenko; S.R. Elliott; L. Fabris; M. Febbraro; A. Gallo Rosso; A. Galindo-Uribarri; M.P. Green; M.R. Heath; S. Hedges; D. Hoang; M. Hughes; T. Johnson; A. Khromov; A. Konovalov; E. Kozlova; A. Kumpan; L. Li; J.M. Link; J. Liu; K. Mann; D.M. Markoff; J. Mastroberti; P.E. Mueller; J. Newby; D.S. Parno; S.I. Penttila; D. Pershey; R. Rapp; H. Ray; J. Raybern; O. Razuvaeva; D. Reyna; G.C. Rich; J. Ross; D. Rudik; J. Runge; D.J. Salvat; A.M. Salyapongse; K. Scholberg; A. Shakirov; G. Simakov; G. Sinev; W.M. Snow; V. Sosnovstsev; B. Suh; R. Tayloe; K. Tellez-Giron-Flores; I. Tolstukhin; E. Ujah; J. Vanderwerp; R.L. Varner; C.J. Virtue; G. Visser; T. Wongjirad; Y.-R. Yen; J. Yoo; C.-H. Yu; J. Zettlemoyer; B.A. Johnson

Journal of Instrumentation, Vol.17 No.3, p. P03021

DOI
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