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Showing results 1 to 5 of 5

Issue Date	Title / Author(s) / Citation	File	Altmetrics
2017-04	Accurate Defect Density-of-State Extraction Based on Back-Channel Surface Potential Measurement for Solution-Processed Metal-Oxide Thin-Film Transistors Im, Hwarim; Song, Hyunsoo; Park, Jongjang; Hong, Yewon; Ha, Jewook; Ji, Seon-Beom; Jeong, Jaewook; Hong, Yongtaek IEEE Transactions on Electron Devices, Vol.64 No.4, pp.1683-1688	view file DOI
2017-04	Highly Sensitive and Bendable Capacitive Pressure Sensor and Its Application to 1 V Operation Pressure-Sensitive Transistor Joo, Yunsik; Yoon, Jaeyoung; Ha, Jewook; Kim, Taehoon; Lee, Seunghwan; Lee, Byeongmoon; Pang, Changhyun; Hong, Yongtaek Advanced Electronic Materials, Vol.3 No.4, p. 1600455	view file DOI
2017-08	Efficient Surface Treatment to Improve Contact Properties of Inkjet-Printed Short-Channel Organic Thin-Film Transistors Ha, Jewook; Seo, Jiseok; Lee, Seunghwan; Oh, Eunho; Lee, Takhee; Chung, Seungjun; Hong, Yongtaek Journal of Nanoscience and Nanotechnology, Vol.17 No.8, pp.5718-5721	view file DOI
2020-06	Fluoroelastomer encapsulation for enhanced reliability of solution-processed carbon nanotube thin-film transistors Seo, Jiseok; Ha, Jewook; Lee, Byeongmoon; Kim, Hyeonggyu; Hong, Yongtaek Thin Solid Films, Vol.704, p. 138021	DOI
2020-06	Tunable Stability of All-Inkjet-Printed Double-Gate Carbon Nanotube Thin Film Transistors Yoo, Hyunjun; Ha, Jewook; Kim, Hyeonggyu; Seo, Jiseok; Lee, Soo-Yeon; Hong, Yongtaek IEEE Electron Device Letters, Vol.41 No.6, pp.860-863	DOI

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