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Issue DateTitle / Author(s) / CitationFileAltmetrics
2010-05

Yoon, Sun Och; Kim, Wook Youn; Go, Heounjeong; Paik, Jin Ho; Kim, Ji Eun; Kim, Young A.; Huh, Joo R.; Jeon, Yoon Kyung; Kim, Chul-Woo

American Journal of Surgical Pathology, Vol.34 No.5, pp.645-655

DOI
1