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Showing results 1 to 6 of 6

Issue Date	Title / Author(s) / Citation	File	Altmetrics
2011-11	Electrical Failure and Damage Analysis of Multi-layer Metal Films on Flexible Substrate during Cyclic Bending Deformation Kim, Byoung-Joon; Shin, Hae-A-Seul; Choi, In-Suk; Joo, Young-Chang 2011 18TH IEEE INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS (IPFA), p. 94017
2012-11	Fatigue-Free, Electrically Reliable Copper Electrode with Nanohole Array Kim, Byoung-Joon; Cho, Yigil; Jung, Min-Suk; Shin, Hae-A-Seul; Moon, Myoung-Woon; Han, Heung Nam; Nam, Ki Tae; Joo, Young-Chang; Choi, In Suk Small, Vol.8 No.21, pp.3300-3306	DOI
2014-03	Improving mechanical fatigue resistance by optimizing the nanoporous structure of inkjet-printed Ag electrodes for flexible devices Kim, Byoung-Joon; Haas, Thomas; Friederich, Andreas; Lee, Ji-Hoon; Nam, Dae-Hyun; Binder, Joachim R.; Bauer, Werner; Choi, In Suk; Joo, Young-Chang; Gruber, Patric A.; Kraft, Oliver Nanotechnology, Vol.25 No.12, p. 12	DOI
2014-12	Effect of film thickness on the stretchability and fatigue resistance of Cu films on polymer substrates Kim, Byoung-Joon; Shin, Hae-A-Seul; Lee, Ji-Hoon; Yang, Tae-Youl; Haas, Thomas; Gruber, Patric; Choi, In Suk; Kraft, Oliver; Joo, Young-Chang Journal of Materials Research, Vol.29 No.23, pp.2827-2834	DOI
2018-07	Reliability issues and solutions in flexible electronics under mechanical fatigue Yi, Seol-Min; Choi, In Suk; Kim, Byoung-Joon; Joo, Young-Chang Electronic Materials Letters, Vol.14 No.4, pp.387-404	DOI
2020-09	Operation Range-Optimized Silver Nanowire Through Junction Treatment Lee, Jae-Chan; Lee, Jong-Sung; Won, Phillip; Park, Jung Jae; Choi, Seok Hwan; Ko, Seung Hwan; Kim, Byoung-Joon; Lee, So-Yeon; Joo, Young-Chang Electronic Materials Letters, Vol.16 No.5, pp.491-497	DOI

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