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Showing results 1 to 2 of 2

Issue DateTitle / Author(s) / CitationFileAltmetrics
2021-08

Kim, Suwan; Kim, Taewhan

Midwest Symposium on Circuits and Systems, pp.224-227

DOI
2022-03

Kim, Suwan; Kim, Taewhan

PROCEEDINGS OF THE 2022 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE 2022), pp.778-783

DOI
1