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Issue Date	Title / Author(s) / Citation	File	Altmetrics
2020-04	Analysis on Process Variation Effect of 3D NAND Flash Memory Cell through Machine Learning Model Lee, Jang Kyu; Ko, Kyul; Shin, Hyungcheol 2020 IEEE ELECTRON DEVICES TECHNOLOGY AND MANUFACTURING CONFERENCE (EDTM 2020), p. 9117940	DOI
2021-06	Long-term reliable physical health monitoring by sweat pore-inspired perforated electronic skins Yeon, Hanwool; Lee, Haneol; Kim, Yeongin; Lee, Doyoon; Lee, Youngjoo; Lee, Jong-Sung; Shin, Jiho; Choi, Chanyeol; Kang, Ji-Hoon; Suh, Jun Min; Kim, Hyunseok; Kum, Hyun S.; Lee, Jaeyong; Kim, Daeyeon; Ko, Kyul; Ma, Boo Soo; Lin, Peng; Han, Sangwook; Kim, Sungkyu; Bae, Sang-Hoon; Kim, Taek-Soo; Park, Min-Chul; Joo, Young-Chang; Kim, Eunjoo; Han, Jiyeon; Kim, Jeehwan Science Advances, Vol.7 No.27	DOI