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Issue DateTitle / Author(s) / CitationFileAltmetrics
2022-01

Kim, Jeehye; Jang, Youn Jeong; Baek, Woonhyuk; Lee, A. Reum; Kim, Jae-Yup; Hyeon, Taeghwan; Lee, Jae Sung

ACS Applied Materials and Interfaces, Vol.14 No.1, pp.603-610

DOI
1