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Issue Date	Title / Author(s) / Citation	File	Altmetrics
2015-04	Influence of Preferred Gate Metal Grain Orientation on Tunneling FETs Choi, Kyoung Min; Lee, Won-Sok; Lee, Keun-Ho; Park, Young-Kwan; Choi, Woo Young IEEE Transactions on Electron Devices, Vol.62 No.4, pp.1353-1356	DOI