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Issue Date	Title / Author(s) / Citation	File	Altmetrics
2021-01	Measurement of Ion Motion Caused by Laser-Induced Stray Charges on Microfabricated Ion Trap Chip Surfaces Jung, Changhyun; Lee, Woojun; Jeong, Junho; Kim, Taehyun; Cho, Dong-il Dan Proceedings - 2021 IEEE International Conference on Quantum Computing and Engineering, QCE 2021, pp.431-432	DOI