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Issue Date	Title / Author(s) / Citation	File	Altmetrics
2002-02	The effect of Ar/O2 ratio on electrochromic response time of Ni oxides grown using an RF sputtering system Ahn, KS; Nah, YC; Yum, JH; Sung, Yung-Eun Japanese Journal of Applied Physics, Vol.41 No.2B, pp.L212-L215	DOI
2002-05	The effect of RF power on the electrochromic response time of sputter-deposited Ni oxide films Ahn, KS; Nah, YC; Sung, Yung-Eun Japanese Journal of Applied Physics, Vol.41 No.5A, pp.L533-L535	DOI
2002-07	Thickness-dependent microstructural and electrochromic properties of sputter-deposited Ni oxide films Ahn, KS; Nah, YC; Sung, Yung-Eun Journal of Vacuum Science and Technology A, Vol.20 No.4, pp.1468-1474	DOI
2002-07	Pt-WOx electrode structure for thin-film fuel cells Park, KW; Ahn, KS; Choi, JH; Nah, YC; Kim, YM; Sung, Yung-Eun Applied Physics Letters, Vol.81 No.5, pp.907-909	DOI
2002-08	Microstructural and electrochromic properties of sputter-deposited Ni oxide films grown at different working pressures Ahn, KS; Nah, YC; Sung, Yung-Eun Journal of Applied Physics, Vol.92 No.3, pp.1268-1273	DOI
2002-10	Surface morphological, microstructural, and electrochromic properties of short-range ordered and crystalline nickel oxide thin films Ahn, KS; Nah, YC; Sung, YE Applied Surface Science, Vol.199 No.1-4, pp.259-269	DOI
2002-11	All-solid-state electrochromic device composed of WO3 and Ni(OH)2 with a Ta2O5 protective layer Ahn, KS; Nah, YC; Sung, YE; Cho, KY; Shin, SS; Park, JK Applied Physics Letters, Vol.81 No.21, pp.3930-3932	DOI
2002-12	Electrochromic properties of SnO2-incorporated Ni oxide films grown using a cosputtering system Ahn, KS; Nah, YC; Sung, YE Journal of Applied Physics, Vol.92 No.12, pp.7128-7132	DOI
2004-08	Electrochemical and electrochromic properties of Ni oxide thin films prepared by a sol-gel method Park, JY; Ahn, KS; Nah, YC; Shim, HS; Sung, YE Journal of Sol-Gel Science and Technology, Vol.31 No.1-3, pp.323-328	DOI
2005-10	Polymer-laminated electrochromic devices composed of WO3 and Ni(OH)(2) on glass and PET substrates Nah, YC; Ahn, KS; Cho, KY; Park, JY; Shim, HS; Lee, YM; Park, JK; Sung, YE Journal of the Electrochemical Society, Vol.152 No.12, pp.H201-H204	DOI

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