S-Space

Browse

Author

Showing results 1 to 1 of 1

Issue Date	Title / Author(s) / Citation	File	Altmetrics
2020-07	Recent progress in controlled nano/micro cracking as an alternative nano-patterning method for functional applications Jung, Jinwook; Kim, Kyun Kyu; Suh, Young. D.; Hong, Sukjoon; Yeo, Junyeob; Ko, Seung Hwan Nanoscale horizons, Vol.5 No.7, pp.1036-1049	DOI