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Issue Date	Title / Author(s) / Citation	File	Altmetrics
2011-08	Circuit techniques for noise robustness in deep submicron digital design Rahul Singh	link
2015-09	A Wide-Range On-Chip Leakage Sensor Using a Current-Frequency Converting Technique in 65-nm Technology Node Kang, Yesung; Choi, Jaehyouk; Kim, Youngmin IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, Vol.62 No.9, pp.846-850	DOI