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Issue DateTitle / Author(s) / CitationFileAltmetrics
2016-08view file
2023-12

Jo, Yongwoo; Kim, Juyeop; Shin, Yuhwan; Park, Hangi; Hwang, Chanwoong; Lim, Younghyun; Choi, Jaehyouk

IEEE Journal of Solid-State Circuits, Vol.58 No.12, pp.3338-3350

DOI
1